摘要
We study the uniformity of two-level -type designs based on the centered and wrap-around -discrepancies. Based on the known formulation of the measures of uniformity, we present some new lower bounds to centered and wrap-around -discrepancies, which can be used as benchmarks in searching uniform -type designs or helping to proof that a good design is in fact uniform. Using the efficient algorithm proposed in聽, some two-level uniform designs are obtained.