Elucidating the microwave dielectric properties of (Mg_{(1鈭?span style='font-style: italic'>x)}Zn_x)₂SnO₄ ceramics

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• 作者：Yih-Chien Chen ; ^{EE049@mail.lhu.edu.tw} ; ^{ycchenncku@yahoo.com.tw}
• 关键词：(Mg0.93Zn0.07)2SnO4 ; X-ray diffraction pattern ; Dielectric constant ; Quality factor ; Temperature coefficient of resonant frequency
• 刊名：Journal of Alloys and Compounds
• 出版年：2012
• 期刊代码：45_09258388
• 类别：ms
• 出版时间：25 June, 2012
• 卷：527
• 期：Complete
• 页码：84-89
• 文件大小：1003 K

摘要

The microwave dielectric properties of (Mg_(1鈭?em>x)Zn_x)₂SnO₄ ceramics were examined with a view to their exploitation for mobile communication. The (Mg_(1鈭?em>x)Zn_x)₂SnO₄ ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the (Mg_0.93Zn_0.07)₂SnO₄ ceramics revealed no significant variation of phase with sintering temperatures. Dielectric constant of 8.50, quality factor (Q 脳 f) of 186,100 GHz, and temperature coefficient of resonant frequency of 鈭?1 ppm/掳C were obtained for (Mg_0.93Zn_0.07)₂SnO₄ ceramics that were sintered at 1550 掳C for 4 h.