Photoemission investigations on nanostructured TiOb>2 b> grown by cluster assembling
- 作者：T. Caruso ; C. Lenardi ; T. Mazza ; A. Policicchio ; G. Bongiorno ; R.G. Agostino ; G. Chiarello ; E. Colavita ; P. Finetti ; K.C. Prince ; et al.
- 刊名：Surface Science
- 出版年：2007
- 期刊代码：104_00396028
- 类别：ch
- 出版时间：1 July 2007
- 卷：601
- 期：13
- 页码：2688-2691
- 文件大小：404 K
摘要
Nanostructured titanium dioxide (ns-TiOb>2 b>) films were grown by supersonic cluster beam deposition method. Transmission electron microscopy demonstrated that films are mainly composed by TiOb>2 b> nanocrystals embedded in an amorphous TiOb>2 b> phase while their electronic structure was studied by photoemission spectroscopy. The cluster assembled ns-TiOb>2 b> films are expected to exhibit several structural and chemical defects owing to the large surface to volume ratio of the deposited clusters. Ultraviolet photoemission spectra (hv = 50 eV) from the valence band unveil the presence of a restrained amount of surface Ti 3d defect states in the band gap, whereas Ti 2p core level X-ray photoelectron (hv = 630 eV) spectra do not manifestly disclose these defects.