Swift heavy ion induced modifications of fullerene C₇₀ thin films

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• 作者：Rahul Singhal ; Amit Kumar ; Y.K. Mishra ; S. Mohapatra ; J.C. Pivin ; D.K. Avasthi
• 关键词：Fullerene ; Ion irradiation ; Raman spectroscopy ; Electronic energy loss
• 刊名：Nuclear Instruments and Methods in Physics Research Section B ; Beam Interactions with Materials and Atoms
• 出版年：2008
• 期刊代码：42_0168583x
• 类别：ph
• 出版时间：July 2008
• 卷：266
• 期：14
• 页码：3257-3262
• 文件大小：562 K

摘要

Modifications of the C₇₀ molecule (fullerene) under swift heavy ion irradiation are investigated. C₇₀ thin films were irradiated with 120 MeV Au ions at fluences from 1 × 10¹² to 3 × 10¹³ ions/cm². The energetic ion impacts lead to the destruction of the C₇₀ molecule. To investigate the stability of C₇₀ fullerene, the damage cross-section and radius of the damaged cylindrical zones are evaluated by fitting the evanescence of C₇₀ vibration modes recorded by Raman spectroscopy. Conductivity measurements together with Raman and optical absorption studies revealed that an irradiation fluence of 3 × 10¹³ ions/cm² results in complete amorphization of the carbon structure of the fullerene molecules.