Formation of metallic indium during atomic hydrogen cleaning of InN(0 0 0 1) surfaces
- 作者：M. Draxler ; M. Walker and C.F. McConville
- 关键词：CAICISS ; LEED ; XPS ; InN ; Surface structure ; Metallic In
- 刊名：Nuclear Instruments and Methods in Physics Research Section B ; Beam Interactions with Materials and Atoms
- 出版年：2006
- 期刊代码：42_0168583x
- 类别：ph
- 出版时间：August 2006
- 卷：249
- 期：1-2
- 页码：886-889
- 文件大小：161 K
摘要
We have used coaxial impact collision ion scattering spectroscopy (CAICISS), low energy electron diffraction (LEED) and X-ray photoelectron spectroscopy (XPS) to investigate the influence of atomic hydrogen cleaning (AHC) on the composition and structure of MBE grown InN(0 0 0 1) surfaces. Evaluation of the CAICISS data showed that metallic In droplets formed during non-optimised AHC, while LEED indicated a well ordered surface and XPS revealed residual C and O contaminations. Careful comparison of simulated and experimental polar angle scans of the CAICISS data revealed that the observed polar angle peak at 58° is solely related to the formation of metallic In on the InN surface.