Atom probe crystallography: Atomic-scale 3-D orientation mapping

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• 作者：Vicente J. Araullo-Peters ; Baptiste Gault ; Sachin L. Shrestha ; Lan Yao ; Michael P. Moody ; Simon P. Ringer ; Julie M. Cairney ; ^{julie.cairney@sydney.edu.au}
• 关键词：Atom probe tomography ; Nanostructure ; Nanocrystalline materials ; Texture ; Orientation imaging microscopy (OIM)
• 刊名：Scripta Materialia
• 出版年：2012
• 期刊代码：157_13596462
• 类别：et
• 出版时间：June, 2012
• 卷：66
• 期：11
• 页码：907-910
• 文件大小：822 K

摘要

Understanding the relationship between atomic-scale structure and properties is becoming increasingly critical as microstructures are now tailored at the nanometre length scale. Here we demonstrate 3-D mapping of grain orientations through atom probe tomography by utilizing Hough transforms to extract the orientation of crystallographic directions. The disorientation across boundaries is also determined. We are now able to combine the powerful capability of atom probe for measuring the 3-D distribution of atoms with the new ability to provide accurate crystallographic information.