Efficient algorithms to accurately compute derating factors of digital circuits

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• 作者：Hossein Asadi^a ; ^{asadi@sharif.edu} ; Mehdi B. Tahoori^b ; ^{mehdi.tahoori@kit.edu} ; Mahdi Fazeli^a ; ¹ ; ^{m_fazeli@ce.sharif.edu} ; Seyed Ghassem Miremadi^a ; ^{miremadi@sharif.edu}
• 刊名：Microelectronics Reliability
• 出版年：2012
• 期刊代码：128_00262714
• 类别：et
• 出版时间：June, 2012
• 卷：52
• 期：6
• 页码：1215-1226
• 文件大小：964 K

摘要

Fast, accurate, and detailed Soft Error Rate (SER) estimation of digital circuits is essential for cost-efficient reliable design. A major step to accurately estimate a circuit SER is the computation of failure probability, which requires the computation of three derating factors, namely logical, electrical, and timing derating. The unified treatment of these derating factors is crucial to obtain accurate failure probability. Existing SER estimation techniques are either unscalable to large circuits or inaccurate due to lack of unified treatment of all derating factors. In this paper, we present fast and efficient algorithms to estimate SERs of circuit components in the presence of single event transients by unified computation of all derating factors. The proposed algorithms, based on propagation of error probabilities and shape of erroneous waveforms, are scalable to very large circuits. The experimental results and comparisons with Statistical Fault Injections (SFIs) using Monte-Carlo simulations confirm the accuracy (only 2%difference) and speedup (5-6 orders of magnitudes) of the proposed technique.