Changes in the Auger Electron Intensities During Reconstruction of Se and Te Films Deposited on Au(111) Surfaces

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• 作者：Seiichi Nagashima ; ^{nagasima@ge.ce.nihon-u.ac.jp}
• 关键词：Auger electron spectroscopy (AES) ; Low-energy electron diffraction (LEED) ; Surface reconstruction ; Selenium ; Tellurium ; Au(111) surface
• 刊名：Physics Procedia
• 出版年：2012
• 期刊代码：P128_18753892
• 类别：ph
• 出版时间：2012
• 卷：32
• 期：Complete
• 页码：896-902
• 文件大小：905 K

摘要

Using low-energy electron diffraction (LEED) and Auger electron spectroscopy (AES), we have investigated the relationship between Auger peak-to-peak intensity and reconstruction of Se and Te films deposited on Au(111) substrate at 298K in an ultrahigh vacuum. The experimental results show that in case of Se/Au(111), the Auger peakto- peak intensity from Au(111) substrate increases temporarily as the (鈭? 脳 鈭?)R30掳-Se structure changes to the (1 脳 鈭?7)R79.1掳-Se structure and that in case of Te/Au(111), the Auger peak-to-peak intensity from Au(111) substrate also increases temporarily as the incommensurate (鈭? 脳 鈭?)R30掳-Te structure changes to the (3 脳 3)-Te structure. We have proposed the possible models to interpret a small increase in the Auger peak-to-peak intensity from Au substrate.