Degradation analysis in asymmetric sampled grating distributed feedback laser diodes
- 作者：Han Sung Joo ; Sang-Wan Ryu ; Jeha Kim ; Ilgu Yun
- 关键词：Distributed feedback laser diode ; Reliability ; Degradation ; Current– ; voltage characteristics
- 刊名：Microelectronics Journal
- 出版年：2007
- 期刊代码：72_00262692
- 类别：ms
- 出版时间：June-July 2007
- 卷：38
- 期：6-7
- 页码：740-745
- 文件大小：236 K
摘要
This paper presents the experimental observation of the degradation in asymmetric sampled grating DFB lasers by the accelerated life tests. Two degradation phenomena related to the electrical characteristics of LDs are observed during the tests. The first degradation phenomenon by increasing the reverse current is considered as a formation of leakage current path enough to prevent lasing operation in lateral blocking layer near active region of lasers. The second degradation phenomenon by decreasing the forward current is considered as activation of non-radiative Auger recombination process by thermal energy. It is also experimentally observed that the second degradation phenomenon is recovered after remained in room temperature with no electrical stress. Therefore, the criteria for LD reliability can be determined by observing the degradation of the reverse current–voltage characteristics.