Mitigation of fluorescence and scattering in reflection convex-crystal X-ray spectrometers
- 作者：C.I. Szabó ; L.T. Hudson ; A. Henins ; G.E. Holland ; R. Atkin and J.F. Seely
- 关键词：X-ray spectroscopy ; X-ray fluorescence ; Crystal spectrometer ; X-ray scattering
- 刊名：Radiation Physics and Chemistry
- 出版年：2006
- 期刊代码：68_0969806x
- 类别：ph
- 出版时间：November 2006
- 卷：75
- 期：11
- 页码：1824-1829
- 文件大小：440 K
摘要
X-ray diagnostics in today's high-energy density environments must contend with intense and energetic X-ray background levels. In this work, we address the issues of X-ray fluorescence and scattering in reflection-geometry X-ray crystal spectrometers. In this geometry, the detector can capture not only a dispersed X-ray spectrum but also fluorescence and/or scattered X-rays from the diffracting crystal and crystal mounts. Studies to optimally reduce these sources of spectral contamination have been performed using the HENEX spectrometer. Variables that mitigate such unwanted background include filtration, collimation and judicious selection of crystal and detector materials.