Stereo-PEEM for three-dimensional atomic and electronic structures of microscopic materials
- 作者：Hiroshi Daimon ; Hiroyuki Matsuda ; Laszlo Toth ; Fumihiko Matsui
- 关键词：PEEM ; Stereo-PEEM ; Display-type spherical mirror analyzer ; Stereophotography
- 刊名：Surface Science
- 出版年：2007
- 期刊代码：104_00396028
- 类别：ch
- 出版时间：15 October 2007
- 卷：601
- 期：20
- 页码：4748-4753
- 文件大小：1035 K
摘要
The principle and design of a new photoemission electron microscope (PEEM), which is called Stereo-PEEM, is described here. Stereo-PEEM can display not only the image of microscopic materials but also the angular distribution of high-energy photoelectrons up to about ±60°, which is about 100-fold the acceptance angle of usual PEEM. This wide angle acceptance for high-energy photoelectrons enables the three-dimensional (3D) display of atomic structure as well as the 3D electronic structure of individual micromaterials. The 3D atomic structure of a sample can be observed directly by taking stereophotographs using photons with angular momentum.