X-ray photoelectron spectroscopy analysis for undegraded and degraded Gdb>2b>Ob>2b>S:Tb³⁺ phosphor thin films

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• 作者：J.J. Dolo ^{dolojj@qwa.ufs.ac.za} ; H.C. Swart ; ^{swarthc@ufs.ac.za} ; J.J. Terblans ; E. Coetsee ; O.M. Ntwaeaborwa ; B.F. Dejene
• 关键词：Gd2O2S ; Tb3+ ; PLD ; Thin films ; CL ; PL ; XPS ; Electron degradation
• 刊名：Physica B
• 出版年：2012
• 期刊代码：53_09214526
• 类别：ph
• 出版时间：15 May, 2012
• 卷：407
• 期：10
• 页码：1586-1590
• 文件大小：636 K

摘要

This paper presents the X-ray Photoelectron Spectroscopy (XPS) analysis for the undegraded and degraded Gdb>2b>Ob>2b>S:Tb³⁺ thin film phosphor. The thin films were grown with the pulsed laser deposition (PLD) technique. XPS measurements were done on Gdb>2b>Ob>2b>S:Tb³⁺ phosphor thin films before and after electron degradation. The XPS technique has proven the presence of Gdb>2b>Ob>3b> on the degraded and undegraded thin film spots. The presence of the SOb>2b> bonding was also detected after degradation. This clearly indicates that surface reactions did occur during prolonged electron bombardment in an oxygen atmosphere.