Structure and properties of SnS films prepared by electro-deposition in presence of EDTA
详细信息查看全文 | 推荐本文 |
摘要
SnS thin films were deposited onto indium tin oxide (ITO) glass substrates by constant potential cathodic electro-deposition from aqueous solution containing stannous sulfate, ethylenediamine tetraacetate acid and sodium thiosulfate. The co-deposited potential was explored by cyclic voltammetry and the deposition potential (E) was roughly determined to be more negative than −0.70 V (vs. saturated calomel electrode, SCE). The analysis of the composition of the as-deposited films by X-ray fluorescence spectrometer indicated that stoichiometric SnS films could be obtained under the condition of E = −0.95 to −1.00 V. The films deposited at E = −1.00 V were characterized with X-ray diffraction (XRD), scanning electron microscope (SEM), and their transmission and reflectance spectra were measured. The as-deposited films were polycrystalline SnS compound with orthorhombic crystalline structure and the ratio of Sn and S was nearly 1. The films were uniform and compact with small grains. The direct band gap of the films was estimated to be about 1.10–1.43 eV with an absorption coefficient near the fundamental absorption edge larger than 4 × 104 cm−1.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700