Mechanical spectroscopy of thin polystyrene films
- 作者：Tatjana Haramina ; Reiner Kirchheim ; Arti Tibrewala ; Erwin Peiner
- 关键词：Mechanical spectroscopy ; Thin film ; Glass transition
- 刊名：Polymer
- 出版年：2008
- 期刊代码：83_00323861
- 类别：ms
- 出版时间：15 April 2008
- 卷：49
- 期：8
- 页码：2115-2118
- 文件大小：391 K
摘要
Mechanical spectroscopy is applied to thin polystyrene films of 7.5–730 nm thickness spin coated on a thin silicon reed. Below a thickness of 100 nm, the 
-relaxation peak (glass transition) broadens considerably and shifts to lower temperatures by a few degrees. These effects are attributed to a different polymer dynamics at the polymer/vacuum and the polymer/silicon interfaces.
-relaxation peak (glass transition) broadens considerably and shifts to lower temperatures by a few degrees. These effects are attributed to a different polymer dynamics at the polymer/vacuum and the polymer/silicon interfaces.