An investigation on substrate temperature and copper to sulphur molar ratios on optical and electrical properties of nanostructural CuS thin films prepared by spray pyrolysis method

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• 作者：Mehdi Adelifard^a ; Hosein Eshghi^a ; ^{h_eshghi@shahroodut.ac.ir} ; Mohamad Mehdi Bagheri Mohagheghi^b
• 关键词：Semiconductors ; Nanostructures ; Optical properties ; Electrical properties ; Spray pyrolysis
• 刊名：Applied Surface Science
• 出版年：2012
• 期刊代码：6_01694332
• 类别：ms
• 出版时间：15 May, 2012
• 卷：258
• 期：15
• 页码：5733-5738
• 文件大小：1448 K

摘要

Copper sulphide (CuS) thin films have been deposited on glass substrates by spray pyrolysis method using an aqueous solutions of copper (II) acetate and thiourea with different Cu to S molar ratios (0.33 and 0.43) at various substrate temperatures of 260, 285 and 310 掳C. The structural, optical and electrical characterizations have been carried out using XRD, UV-Vis. transmittance/reflectance, PL spectra and Hall effect measurements. These characterizations indicated the formation of a CuS single phase (covellite) with polycrystalline nature with preferred orientation along (1 0 2) plane, except one with amorphous nature. Optical studies showed that the deposited layers have a relatively high absorption coefficient (5 脳 10⁴ to 1 脳 10⁵ cm^鈭?) in the visible range, with an effective optical band gap of 鈭?.4-2.6 eV. The Hall effect data showed that all the grown samples have a degenerate p-type conductivity with a hole concentration of 鈭?.8 脳 10²⁰ to 1.7 脳 10²¹ cm^鈭?.