Development of a soft X-ray pulse height analyzer on the J-TEXT tokamak
- 作者：W. Jin ; G. Zhuang ; ge-zhuang@mail.hust.edu.cn ; Y.H. Ding ; Y. Zhang ; J. Zhang ; The J-TEXT team
- 关键词：Soft X-ray ; Pulse height analysis ; Tokamak ; Line radiation
- 刊名：Nuclear Instruments and Methods in Physics Research Section A ; Accelerators ; Spectrometers ; Detectors and Associated Equipment
- 出版年：2012
- 期刊代码：41_01689002
- 类别：ph
- 出版时间：11 May, 2012
- 卷：674
- 期：Complete
- 页码：15-19
- 文件大小：549 K
摘要
A soft X-ray pulse height analyzer has been designed and installed on the J-TEXT tokamak for measuring the electron temperature and possibly for monitoring the impurity content and concentration. A multi-channel analyzer, a set of amplifiers, and three silicon drift detectors constitute the detection system. An off-line analysis code was developed to analyze the raw data recorded by the system. The system can measure a minimum electron temperature of 400 eV, and its routine operation provides electron temperature measurements at three different positions with a temporal resolution of 60 ms and channel separation of 18 cm. Line radiation from some moderate and high Z impurities are observable by the system. The results show that the intensity of line radiation from heavy impurity ions is inversely proportional to the plasma density under similar discharge conditions.