摘要
Crosslinked and non-crosslinked polytetrafluoroethylene films (RX-PTFE and V-PTFE films, respectively) were irradiated by 脦脦-ray and then grafted with styrene in liquid phase. Microscope FT-IR spectroscopy, TGA, solid state 13C CP/MAS and high resolution HS/MAS NMR spectroscopy, wide-angle X-ray diffraction (WAXD) study were used to get the structural information of the styrene grafted RX-PTFE and V-PTFE films. From microscope FT-IR spectra of the grafted RX-PTFE films, the 脦脦脦grafting front mechanism脦脦脦 was proved. TGA analysis showed that the grafted films have a small degradation step and two main degradation steps. In the 13C CP/MAS NMR spectra of the non-grafted films, there are no signal due to the absence of the hydrogen atom. While in the spectra of the grafted films, there are signals attributed to the polystyrene grafts. In the 13C HS/MAS NMR spectra of the grafted films, the relative intensity of the peaks attributed to the polystyrene grafts increased while the relative intensity of the peak attributed to PTFE matrix decreased with the increase in the DOG. From WAXD patterns, the intensity of the crystalline peak decrease with the increase in the DOG. The grafted films were sulfonated by chlorosulfonic acid and the results of highest IEC value exceeded 3.0. Those results will be reported in the near future.