Photoluminescence and scintillation of LGS (La<sub>3sub>Ga<sub>5sub>SiO<sub>14sub>), LNGA (La<sub>3sub>Nb<sub>0.5sub>Ga<sub>5.3sub>Al<sub>0.2sub>O<sub>14sub>) and LTGA (La<sub>3sub>Ta<sub>0.5sub>Ga<sub>5.3sub>Al<sub>0.2sub>O<sub>14
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摘要
To examine scintillation response of piezoelectric crystals the <sup>241sup>Am 5.5 MeV -ray excited emission spectra of langasite family crystals, LGS (La<sub>3sub>Ga<sub>5sub>SiO<sub>14sub>), LNGA (La<sub>3sub>Nb<sub>0.5sub>Ga<sub>5.3sub>Al<sub>0.2sub>O<sub>14sub>) and LTGA (La<sub>3sub>Ta<sub>0.5sub>Ga<sub>5.3sub>Al<sub>0.2sub>O<sub>14sub>) were measured. Dominating emission bands were observed at 378 nm for LGS, 556 nm for LNGA and 425 nm for LTGA. X-ray excited radioluminescence intensity of these crystals was quantitatively compared with BGO standard scintillator. Photoluminescence 2D-spectra were measured as well and compared with radioluminescence ones. In LTGA also photoluminescence decays were measured for two dominant contributing emission centers.

Observed emission bands within 300-360 nm and beyond 400 nm most probably belong to self-trapped or trapped excitons and lattice defects, respectively.

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