Relation between mechanical microhardness and impedance variations in eddy current testing

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• 作者：Zergoug ; M. ; Lebaili ; S. ; Boudjellal ; H. ; Benchaala ; A.
• 关键词：NDT ; Eddy current ; Microstructure ; Impedance ; Micro hardness
• 刊名：NDT and E International
• 出版年：2004
• 期刊代码：38_09638695
• 类别：ph
• 出版时间：January, 2004
• 卷：37
• 期：1
• 页码：65-72
• 文件大小：253 K

摘要

According to the state of the art, eddy current testing (EC) has a strong application in defect detection. The sensitivity to characterize defects and other parameters can be improved by an optimal choice of probes and operation frequency.