Aseptic Sampling Device for pharmaceutical and bioprocess indusrty
- 关键词：Bifurcation ; Inclusion ; yle="text-decoration ; none ; color ; black" href="/science?_ob=MathURL&_method=retrieve&_udi=B6V0Y-4NVH7R8-9&_mathId=mml1&_user=1067359&_cdi=5659&_rdoc=30&_acct=C000050221&_version=1&_userid=10&md5=baa42410cc8a0
- 刊名：Filtration and Separation
- 出版年：2008
- 期刊代码：29_00151882
- 类别：ce
- 出版时间：May 2008
- 卷：45
- 期：5
- 页码：15
- 文件大小：137 K
摘要
This paper outlines the Level 2 portion of a methodology for determining the incremental induced steam generator tube rupture large early release fraction caused by an actual through-wall defect. This defect was responsible for the minor steam generator tube leak that occurred in September 2002 at the Comanche Peak Steam Electric Station Unit 1. In order to quantify the performance of the defect over the operating cycle, a range of defect lengths were input to the PROBFAIL computer code [Kenton, M., 2001. PROBFAIL: A Computer Code for Evaluating the Likelihood of Steam Generator Tube Rupture in Severe Nuclear Power Plant Accidents, CREARE TM-2138], using appropriate boundary conditions derived from MAAP4 [Henry, R., et al., May 1994. MAAP4—Modular Accident Analysis Program for LWR Power Plants, Computer Code Manual, EPRI Research Project 3131-02] runs. From the analysis of the calculated times of burst for each assumed defect length, the minimum through-wall defect length necessary for tube burst to occur prior to hot leg or surge line creep rupture was calculated. The probability that the defect would actually have this length was then estimated by determining the fraction of the cycle for which the defect would be at least that long. The methodology development and implementation relied on MAAP4 runs, which are discussed extensively in connection with their role in: (1) guiding the construction of the accident progression event tree, (2) generating relevant information for probability assignments in the various underlying fault trees and (3) obtaining boundary conditions of pressure and temperature for use in PROBFAIL. The overall increment in LERF due to the existence of the defect was calculated to be approximately 4E−08.