A highly mismatched InxGa1−xAs/AlGaAs (0 x 0.5) pseudomorphic HEMT on GaAs substrate using an Inx/2Ga1−x/2As buffer layer
详细信息查看全文 | 推荐本文 |
摘要
A pseudomorphic HEMT with a large InAs mole fraction (x) for the channel is fabricated successfully on a GaAs substrate by employing a thick Inx/2Ga1 - x/2As buffer layer. The transconductance increases with increasing InAs mole fraction, and shows a peak value at x = 0.4. The maximum transconductance and the cutoff frequency for a 1.7 μm gate HEMT with x = 0.4 were 500 mS mm−1 and 13.3 GHz, respectively. The effective saturation velocity evaluated using the cutoff frequency increased with increasing x.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700