Swift heavy ion induced structural, iono and photoluminescence properties of 尾-CaSiO₃:Dy³⁺ nanophosphor

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• 作者：D.V. Sunitha^a ; H. Nagabhushana^a ; ^{bhushanvlc@gmail.com} ; Fouran Singh^b ; N. Dhananjaya^c ; S.C. Sharma^a ; B.M. Nagabhushana^d ; C. Shivakumara^e ; R.P.S. Chakradhar^f
• 关键词：Nanophosphor ; Heavy ion irradiation ; XRD ; FTIR ; Ionoluminescence
• 刊名：Spectrochimica Acta Part A ; Molecular and Biomolecular Spectroscopy
• 出版年：2012
• 期刊代码：99_13861425
• 类别：ch
• 出版时间：July, 2012
• 卷：93
• 期：Complete
• 页码：300-305
• 文件大小：718 K

摘要

CaSiO₃:Dy³⁺ (1-5 mol%) nanophosphors have been prepared by a low temperature solution combustion method. The structural and luminescence (ionoluminescence; IL and photoluminescence; PL) studies have been carried out for pristine and ion irradiated samples. The XRD patterns of pristine sample show a prominent peak at (3 2 0) for the monoclinic structure of 尾-CaSiO₃. Upon ion irradiation, the intensity of the prominent peak is decreased at the fluence of 7.81 脳 10¹² ions cm^鈭? and at higher fluence of 15.62 脳 10¹² ions cm^鈭?, the prominent peak completely vanishes. The decrease in peak intensity might be due to the stress induced point defects. On-line IL and in situ PL studies have been carried out on pelletized samples bombarded with 100 MeV Si⁷⁺ ions with fluences in the range (7.81-15.62) 脳 10¹² ions cm^鈭?. The characteristic emission peaks at 481,574, 664 and 754 nm recorded in both IL and PL are attributed to the luminescence centers activated by Dy³⁺ ions. It is found that IL and PL emissions intensity decreases with increase in Si⁷⁺ ion fluence. The decrease in intensity can be due to the destruction of SiOSi and OSiO type species present on the surface of the sample. FTIR studies also confirm the SiOSi and OSiO type species observed to be sensitive for swift heavy ion (SHI) irradiated samples.