Structural and optical properties of In₂O₃ nanostructured thin film

详细信息	查看全文 | 推荐本文 |

• 作者：M.A. Majeed Khan^a ; ^{majeed_phys@rediffmail.com} ; Wasi Khan^b ; Maqusood Ahamed^a ; Mansour Alhoshan^a ; ^c
• 关键词：Indium oxide (In2O3) ; Nanocrystalline materials ; Thin films ; Optical bandgap ; X-ray techniques
• 刊名：Materials Letters
• 出版年：2012
• 期刊代码：59_0167577x
• 类别：ms
• 出版时间：15 July, 2012
• 卷：79
• 期：Complete
• 页码：119-121
• 文件大小：549 K

摘要

Indium oxide (In₂O₃) nanostructured thin film was successfully deposited on glass substrate by the spin coating method. The film was characterized by X-ray diffraction (XRD), scanning electron microscope (SEM) equipped with an energy dispersive spectrometer (EDS), field emission transmission electron microscope (FETEM), and UV-vis absorption spectroscopy. SEM and TEM observations confirm the formation of In₂O₃ nanoparticles with average diameter around 20 nm. X-ray diffraction analysis indicates the spherical indium oxide nanoparticles were in single-crystalline phase with body-centered cubic structure. These results indicate that the In₂O₃ film prepared by spin coating method is a promising candidate for photovoltaic device applications.