Assessment of misorientation in metallic and semiconducting nanowires using precession electron diffraction

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• 作者：Sonia Estradé ; ^a ; ^b ; ^{sestrade@ub.edu} ; Joaquim Portillo^b ; ^c ; Joan Mendoza^b ; Ivette Kosta^d ; Maria Serret^d ; Carlos Mü ; ller^d ; Francesca Peir&#243 ; ^a
• 关键词：Precession ; Mapping ; Nanowires
• 刊名：Micron
• 出版年：2012
• 期刊代码：37_09684328
• 类别：ph
• 出版时间：August, 2012
• 卷：43
• 期：8
• 页码：910-915
• 文件大小：1504 K

摘要

Precession electron diffraction (PED) allows for diffraction pattern collection under quasi-kinematical conditions. The combination of PED with fast electron diffraction acquisition and pattern matching software techniques is used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscattered Diffraction technique in Scanning Electron Microscopes at lower magnifications and longer acquisition times. Here we report, for the first time, the application of this PED-based orientation mapping technique to both metallic and semiconducting nanowires.