Application of the diffraction phenomenon for increasing the neutrino flux density

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• 作者：V.A. Trapeznikov^a ; ^b ; ^{xps@fti.udm.ru}
• 关键词：section of interaction of neutrino and substance ; inverse 尾-decay ; x-ray and neutrino diffraction ; x-ray spectrometer with bent crystals ; inverse scheme of the methods of Johann and Cauchois ; neutrino spectrometer
• 刊名：Nuclear Physics B - Proceedings Supplements
• 出版年：2011
• 期刊代码：46_09205632
• 类别：ph
• 出版时间：December, 2011
• 卷：221
• 期：Complete
• 页码：406-409
• 文件大小：145 K

摘要

The investigations of the neutrino physics are connected with great difficulties due to an extremely small section of the interaction of neutrino with a substance. It necessitates enlarging the volumes of a detecting substance to huge sizes. An increase in the density of low-energy neutrino at the detector entrance by several orders (to 1 MeV) is offered with the use of the diffraction phenomenon on the bent crystals in neutrino spectrometers in accordance with the inverse schemes of the methods of Johann and Cauchois. This scheme was used for investigating x-ray radiation from the source situated beyond the focal circle at an unlimited distance from the spectrometer [Trapeznikov V.A., Sapozhnikov V.P. 1970 The application of the x-ray spectrometer with a bent crystal for analyzing the radiation that is beyond the focal circle Pribory i tekhnika eksperimenta, 3, 227]. For the neutrino investigation a large number of crystals with crystal-holders will be needed; the crystal-holders should be situated on one platform with a general direction of a cumulative neutrino beam towards one detector.