X-ray backlight imaging in Z-pinch

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• 作者：Lifeng Liu^a ; ^{liulf1305@yahoo.cn} ; Shali Xiao^a ; Jiayu Qian^a ; Xianbin Huang^b ; Hongchun Cai^b
• 关键词：Spherically bent crystal ; X-ray imaging ; Spatial resolution ; Plasma diagnostics
• 刊名：Nuclear Instruments and Methods in Physics Research Section A ; Accelerators ; Spectrometers ; Detectors and Associated Equipment
• 出版年：2012
• 期刊代码：41_01689002
• 类别：ph
• 出版时间：21 August, 2012
• 卷：684
• 期：Complete
• 页码：93-96
• 文件大小：620 K

摘要

A novel X-ray backlight imaging system has been developed to obtain diagnostic information about implosion targets, wire-array Z-pinch implosions and ablative Rayleigh-Taylor instability. The key component of the imaging system is the spherically bent quartz (1 0 1 0) crystal with a curvature radius of 143 mm. The imaging system is capable of the two-dimensional, spatially resolved, monochromatic backlight imaging. A monochromatic X-ray backlight imaging experiment using the imaging system was performed for the first time on the 鈥淵ang鈥?accelerator at the Chinese Academy of Engineering Physics. The plasma from implosion of aluminium wire arrays was used as the backlighting source. The X-ray film obtained the two-dimensional backlight mesh imaging of He-like aluminium ions. The experimental results show that the X-ray backlight imaging system provides an approximate 75 渭m spatial resolution at a 9 mm脳20 mm field of view. The backlight imaging system is adequate for monochromatic X-ray backlighting imaging diagnosis on the 鈥淵ang鈥?accelerator.