Determination of dispersive optical constants of nanocrystalline CdSe (nc-CdSe) thin films

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• 作者：Kriti Sharma ; Alaa S. Al-Kabbi ; G.S.S. Saini ; S.K. Tripathi ; ^{surya@pu.ac.in} ; ^{surya_tr@yahoo.com}
• 关键词：A. Nanostructures ; A. Thin films ; B. Vapor deposition ; D. Optical properties
• 刊名：Materials Research Bulletin
• 出版年：2012
• 期刊代码：60_00255408
• 类别：ms
• 出版时间：June, 2012
• 卷：47
• 期：6
• 页码：1400-1406
• 文件大小：839 K

摘要

The nanocrystalline thin films of CdSe are prepared by thermal evaporation technique at room temperature. These thin films are characterized by transmission electron microscopy (TEM), scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX), X-ray diffraction (XRD) and photoluminescence spectroscopy (PL). The transmission spectra are recorded in the transmission range 400-3300 nm for nc-CdSe thin films. Transmittance measurements are used to calculate the refractive index (m>nm>) and absorption coefficient (m>伪m>) using Swanepoel's method. The optical band gap () has been determined from the absorption coefficient values using Tauc's procedure. The optical constants such as extinction coefficient (m>km>), real (m>蓻m>₁) and imaginary (m>蓻m>₂) dielectric constants, dielectric loss (tan m>未m>), optical conductivity (m>蟽m>_opt), Urbach energy (m>Em>_u) and steepness parameter (m>蟽m>) are also calculated for nc-CdSe thin films. The normal dispersion of refractive index is described using Wemple-DiDomenico single-oscillator model. Refractive index dispersion is further analysed to calculate lattice dielectric constant (m>蓻m>_L).