Zinc mapping in THM grown detector grade CZT

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• 作者：U.N. Roy^a ; ^{utpalnroy@gmail.com} ; ^{utpal.roy@flir.com} ; S. Weiler^a ; J. Stein^a ; Y. Cui^b ; M. Groza^b ; V. Buliga^b ; A. Burger^b ; ^c
• 关键词：A1. Growth interface ; A1. Segregation ; A2. THM technique ; B2. CdZnTe
• 刊名：Journal of Crystal Growth
• 出版年：2012
• 期刊代码：49_00220248
• 类别：ch
• 出版时间：15 May, 2012
• 卷：347
• 期：1
• 页码：53-55
• 文件大小：316 K

摘要

We have employed photoluminescence mapping at room temperature of detector grade CZT grown by modified Traveling Heater Method (THM) technique and estimated the spatial variation of Zn composition. The composition was found to be fairly uniform over the major portion of the ingot length except near the conical part of the ingot and the upper part of the ingot. Unlike Bridgman growth technique, no detectable striations were observed. The composition was within 卤0.3%over the length little more than 4 cm of the ingot. The growth interface revealed from the composition mapping was found to be reasonably flat.