Potassium-silicate glass exposed to low energy H⁺ beam

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• 作者：Ondrej Gedeon^a ; ^{ondrej.gedeon@vscht.cz} ; Josef Zemek^b ; Petr Jiricek^b
• 关键词：Proton irradiation ; Potassium-silicate glass ; XPS ; Surface relaxation
• 刊名：Nuclear Instruments and Methods in Physics Research Section B ; Beam Interactions with Materials and Atoms
• 出版年：2012
• 期刊代码：42_0168583x
• 类别：ph
• 出版时间：1 June, 2012
• 卷：280
• 期：Complete
• 页码：111-116
• 文件大小：414 K

摘要

Pristine surface of binary potassium silicate glass 85SiO₂路15K₂O was prepared in vacuum and irradiated with a 5 keV proton beam within the range of 0.6-103 C/m². The response of glass surface was monitored by XPS and the evolution of atomic concentrations divided it into two stages. During the first one, amounts of both potassium and non-bridging oxygen (NBO) increase in the surface layer and are governed by surface relaxation. The second stage is characterised by a continuous decrease of NBO and K. Comparison of K and NBO concentrations yielded a constant surplus of K proving the existence of potassium elemental state on the glass surface. Ratio of bridging oxygen (BO) and silicon is conserved during proton bombardment. The extrapolation of the glass response to the enhanced irradiation predicts a formation of substoichiometric SiO_x with some elemental K on the topmost surface.