Short-term Results of Penetrating Keratoplasty Performed with the Femtec Femtosecond Laser

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• 作者：Louis Hoffart ; Helene Proust ; Frederic Matonti ; Bernard Ridings ; John Conrath
• 关键词：DEPFET ; Macropixel ; Silicon Drift Detector ; X-ray astronomy ; X-ray spectroscopy
• 刊名：American Journal of Ophthalmology
• 出版年：2008
• 期刊代码：7_00029394
• 类别：med
• 出版时间：July 2008
• 卷：146
• 期：1
• 页码：50-55.e1
• 文件大小：491 K

摘要

The Depleted P-channel Field Effect Transistor (DEPFET) Macropixel detectors based on the combined detector/amplifier structure have been designed for X-ray spectroscopy applications at the Max-Planck Institute (MPI) Semiconductor Laboratory. Prototypes with several design variants have been fabricated. The outstanding performance of these devices has been previously demonstrated. In this paper, the development of an improved variant is presented, which applies the so-called X-type DEPFET originally designed for XEUS mission as the readout element of a silicon drift detector. The measured energy resolution for Mn-K line at is 122 eV with a pixel size of . The excellent peak/background ratio of the spectra is observed with a collimated ⁵⁵Fe source at ecdd01ac6c39164e75ea1b">. The integral nonlinearity is less than 0.2%up to 160 keV measured with laser charge injection. Homogeneity is also studied with the laser on a computer controlled X–Y stage.