The effects of thermistor linearization techniques on the T-history characterization of phase change materials
- 作者：Stanislava B. Stankovi膰 ; stankovic.stanislava.1@city.ac.uk ; Panayiotis A. Kyriacou
- 关键词：Thermistor ; Linearization technique ; PCM ; T-history method ; Temperature accuracy ; Heat density
- 刊名：Applied Thermal Engineering
- 出版年：2012
- 期刊代码：8_13594311
- 类别：ce
- 出版时间：November, 2012
- 卷：44
- 期：Complete
- 页码：78-84
- 文件大小：893 K
摘要
Phase Change Materials (PCMs) are increasingly being used in the area of energy sustainability. Thermal characterization is a prerequisite for any reliable utilization of these materials. Current characterization methods including the well-known T-history method depend on accurate temperature measurements. This paper investigates the impact of different thermistor linearization techniques on the temperature uncertainty in the T-history characterization of PCMs. Thermistor sensors and two linearization techniques were evaluated in terms of achievable temperature accuracy through consideration of both, non-linearity and self-heating errors. T-history measurements of RT21 (RUBITHERM庐 GmbH) PCM were performed. Temperature measurement results on the RT21 sample suggest that the Serial-Parallel Resistor (SPR) linearization technique gives better uncertainty (less than 卤0.1聽掳C) in comparison with the Wheatstone Bridge (WB) technique (up to 卤1.5聽掳C). These results may considerably influence the usability of latent heat storage density of PCMs in the certain temperature range. They could also provide a solid base for the development of a T-history measuring device.