摘要
In this paper, the micro-mechanics of electrical conductivity increases of poly(vinylidene fluoride) (PVDF) samples induced by KrF excimer laser was analyzed by Raman spectra and infrared spectra. The irradiated layer of the samples was observed by the method of Raman mapping and scanning electron microscope and the thickness of the conducting layer of PVDF samples was determined to be about 6.5 μm. Moreover, the surface microstructure of the irradiated PVDF samples was discussed in the light of scanning electron microscope, Raman spectra and Raman mapping.