Fixed pattern deviations in Si pixel detectors measured using the Medipix1 readout chip
- 作者：Tlustos ; L. ; Davidson ; D. ; Campbell ; M. ; Heijne ; E. ; Mikulec ; B.
- 关键词：07.85.Fv ; 29.40.Wk ; 61.72.T ; Silicon detectors ; Photon counting ; Spatial resolution ; Dopant concentration
- 刊名：Nuclear Instruments and Methods in Physics Research Section A ; Accelerators ; Spectrometers ; Detectors and Associated Equipment
- 出版年：2003
- 期刊代码：41_01689002
- 类别：ph
- 出版时间：August 21, 2003
- 卷：509
- 期：1-3
- 页码：102-108
- 文件大小：467 K
摘要
Dopant fluctuations and other defects in silicon wafers can lead to systematic errors in several parameters in particle or single-photon detection. In imaging applications non-uniformities in sensors or readout give rise to fixed pattern image noise and degradation of achievable spatial resolution for a given flux. High granularity pixel detectors offer the possibility to investigate local properties of the detector material on a microscopic scale. In this paper, we study fixed pattern detection fluctuations and detector inhomogeneities using the Medipix1 readout chip. Low-frequency fixed pattern signal deviations due to dopant inhomogeneities can be separated from high-frequency deviations.