GeHx (x=0–3) and GenHx (n=2–7) in flash pyrolysis of GeH4
- 作者：Chambreau ; Steven D. ; Zhang ; Jingsong
- 刊名：Chemical Physics Letters
- 出版年：2002
- 期刊代码：7_00092614
- 类别：ph
- 出版时间：January 10, 2002
- 卷：351
- 期：3-4
- 页码：171-177
- 文件大小：124 K
摘要
Gas-phase thermal decomposition of germane, GeH4, has been studied using a flash pyrolysis technique (
20μs reaction time), coupled with a vacuum-ultraviolet (VUV) photoionization time-of-flight mass spectrometer (TOFMS). Pyrolysis temperatures ranged from 685 to 1500 K, and resulted in the formation of GeH2 above 900 K and GeHx (x=0,1,3) above 1100 K. In addition, Gen (n
20μs reaction time), coupled with a vacuum-ultraviolet (VUV) photoionization time-of-flight mass spectrometer (TOFMS). Pyrolysis temperatures ranged from 685 to 1500 K, and resulted in the formation of GeH2 above 900 K and GeHx (x=0,1,3) above 1100 K. In addition, Gen (n