Pseudoelastic deformation and size effects during in situ transmission electron microscopy tensile testing of NiTi

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• 作者：S. Manchuraju^a ; ¹ ; A. Kroeger^b ; C. Somsen^b ; A. Dlouhy^c ; G. Eggeler^b ; P.M. Sarosi^d ; P.M. Anderson^a ; ^{anderson.1@osu.edu} ; M.J. Mills^a
• 关键词：Martensitic phase transformation ; In situ TEM ; Shape memory alloys ; Crystallographic theory of martensite
• 刊名：Acta Materialia
• 出版年：2012
• 期刊代码：1_13596454
• 类别：ms
• 出版时间：April, 2012
• 卷：60
• 期：6-7
• 页码：2770-2777
• 文件大小：1245 K

摘要

The stress-induced B2-B19鈥?transformation in aged 51 at.%NiTi was investigated using in situ straining transmission electron microscopy (TEM). Increased applied strain along [1 1 0]b>B2b> transforms B2 into plates containing B19鈥?variants that are related by a (1 1 0)b>B2b> compound twin plane. This atypical twin plane is explained by relaxing the invariant plane constraint in the crystallographic theory of martensite (CTM) to an invariant line constraint. The relaxation is rationalized from the thin foil geometry. The relaxed CTM approach, coupled with conditions to maximize transformation strain along the loading axis and minimize elastic energy, predicts the observed twin interface, diffraction patterns, and interface with the B2 austenite. These results demonstrate subtleties in interpreting thin foil TEM results regarding martensitic transformations, and translating those results to bulk response.