摘要
In the present study stoichiometric, b-axis oriented Laub>5ub>Caub>9ub>Cuub>24ub>Oub>41ub> thin films were grown by pulsed laser deposition on (1 1 0) SrTiOub>3ub> substrates in the temperature range 600-750 掳C. High resolution transmission electron microscopy was employed to investigate the growth mechanism and the epitaxial relationship between the SrTiOub>3ub> substrates and the Laub>5ub>Caub>9ub>Cuub>24ub>Oub>41ub> films grown at 700 掳C. The 3-蠅 method was used to measure the cross-plane thermal conductivity of Laub>5ub>Caub>9ub>Cuub>24ub>Oub>41ub> films in the temperature range 50-350 K. The observed glass-like behavior is attributed to atomic-scale defects, grain boundaries and an interfacial layer formed between film and substrate.