Effects of residual aberrations explored on single-walled carbon nanotubes

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• 作者：Johannes Biskupek^a ; ^{johannes.biskupek@uni-ulm.de} ; Peter Hartel^b ; Maximilian Haider^b ; Ute Kaiser^a
• 关键词：HRTEM ; Aberration correction ; Residual aberration ; Carbon nanotubes
• 刊名：Ultramicroscopy
• 出版年：2012
• 期刊代码：79_03043991
• 类别：ph
• 出版时间：May, 2012
• 卷：116
• 期：Complete
• 页码：1-7
• 文件大小：2060 K

摘要

The effects of geometric residual aberrations such as coma B₂ and two-fold astigmatism A₁ on the contrast in aberration corrected high resolution transmission electron microscopy (HRTEM) images are investigated on single-walled carbon nanotubes (SWNT). The individual aberrations are adjusted and set up manually using an imaging C_S-corrector. We demonstrate how coma B₂ can be recognized by an experienced user directly in the image and how it blurs the contrast. Even with uncorrected (resolution limiting) spherical aberration C_S the coma B₂ has to be considered and must be minimized. Limits for a tolerable coma are given. The experiments are confirmed by image simulations.