Effect of cobalt doping on the structural and optical properties of TiO₂ films prepared by sol–gel process

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• 作者：M. Subramanian ; S. Vijayalakshmi ; S. Venkataraj ; R. Jayavel
• 关键词：Titanium dioxide ; X-ray diffraction ; Ellipsometry ; Sol– ; gel process
• 刊名：Thin Solid Films
• 出版年：2008
• 期刊代码：78_00406090
• 类别：ph
• 出版时间：30 April 2008
• 卷：516
• 期：12
• 页码：3776-3782
• 文件大小：818 K

摘要

Pure and cobalt doped titanium dioxide thin films have been prepared on glass and Si (100) substrates by sol–gel spin coating method. The structural and optical properties of the films as a function of cobalt concentration (up to 15 wt.%) have been systematically studied by Rutherford backscattering spectroscopy, X-ray diffraction, Raman spectroscopy, scanning electron microscopy, optical spectroscopy and spectroscopic ellipsometry methods. Rutherford backscattering studies show the presence of cobalt dopant in the films is almost equal to the precursor stoichiometry. Grazing incidence X-ray diffraction and Raman spectroscopy studies confirm the amorphous phase of the as-deposited films and crystalline anatase phase for the films annealed at 600 °C. The optical spectroscopy measurements show that the films are fully transparent in the visible region and there is a band gap narrowing upon increasing cobalt dopant concentration. The refractive index, band gap (E_g) and thickness of the films were determined from spectroscopic ellipsometry measurements. The refractive index of the films was found to increase from 2.2 to 2.7 with the increase in cobalt concentration with a simultaneous decrease of band gap from 3.1 to 2.8, which is favorable for photocatalytic applications. The packing density of the films was calculated by Clausius–Mossotti relation and is found to increase with cobalt concentration.