Depth profiling of nitrogen using 429 keV and 897 keV resonances in the ¹⁵N(p, αγ)¹²C reaction

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• 作者：Sanjiv Kumar ; S. Vikram Kumar ; G.L.N. Reddy ; Vivekanand Kain ; J.V. Ramana and V.S. Raju
• 关键词：Nitrogen ; ¹⁵N(p ; α ; γ ; )¹²C resonance reaction ; Depth profiling ; Thin films ; Corroded wires
• 刊名：Nuclear Instruments and Methods in Physics Research Section B ; Beam Interactions with Materials and Atoms
• 出版年：2005
• 期刊代码：42_0168583x
• 类别：ph
• 出版时间：2005
• 卷：240
• 期：3
• 页码：704-710
• 文件大小：157 K

摘要

Resonances at 429 keV and 897 keV in the ¹⁵N(p, αγ)¹²C reaction were investigated for depth profiling nitrogen in materials containing nitrogen isotopes in natural abundances. Both resonances exhibit identical sensitivity, however the resonance at 897 keV is prone to interferences from light elements, F and Al in particular. These resonances were employed to depth profile nitrogen in binary and ternary nitride films and in stainless steel wires that had fractured while in use in an ammonia converter vessel of a heavy water plant. The studies indicated the ingress of nitrogen into the interiors of the wires under operating conditions of the plant that lead to nitriding causing embrittlement of the components.