Reel-to-reel deposition of epitaxial double-sided Y2O3 buffer layers for coated conductors
详细信息查看全文 | 推荐本文 |
摘要
Y2O3 films were deposited on both sides of biaxially textured Ni-5 at.%W substrates by reel-to-reel DC. magnetron reactive sputtering, serving as a seed layer for high performance coated conductors. The deposition parameters, such as water vapor pressure, substrate temperature and sputtering power, were systematically studied. The YSZ layer and CeO2 layer were fabricated on Y2O3 buffered Ni-W tapes using the same deposition system. X-ray diffraction analysis confirmed that optimized double-sided CeO2/YSZ/Y2O3 buffer layers showed a significant improvement in in-plane and out-of-plane texture. Atomic force microscope revealed a smooth, dense and crack-free surface morphology. YBa2Cu3O7- films grown on double-sided CeO2/YSZ/Y2O3 buffered Ni-W tapes by D.C. sputtering exhibited a critical current density of 1.26 MA/cm2 at 77 K for each side.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700