MBE-growth of novel MnF<sub>2sub>&ndash;CaF<sub>2sub> superlattices on Si(111) and their characterization

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• 作者：Sokolov ; N.S. ; Takeda ; Y. ; Banshchikov ; A.G. ; Harada ; J. ; Inaba ; K. ; Ofuchi ; H. ; Tabuchi ; M. ; Yakovlev ; N.L.
• 关键词：Molecular beam epitaxy ; MnF<sub>2sub>&ndash ; CaF<sub>2sub> superlattices ; Structural characterization ; Metastable phase ; 81.15.Hi ; 68.65.+g ; SF ; APN ; EL ; EB ; XBD ; HCH ; CEC ; ME10 ; SVL
• 刊名：Applied Surface Science
• 出版年：2000
• 期刊代码：6_01694332
• 类别：ms
• 出版时间：August 1, 2000
• 卷：162-163
• 期：Complete
• 页码：469-473
• 文件大小：413 K

摘要

Novel short-period MnF<sub>2sub>&ndash;CaF<sub>2sub> superlattices (SLs) on Si(111) substrates have been grown by molecular beam epitaxy. The thickness of a MnF<sub>2sub> layer was 1&ndash;3 molecular layers. Reflection high-energy electron diffraction studies indicated the fluorite type of crystal structure of these layers. Fluorescent extended X-ray absorption fine structure measurements supported this observation. Atomic force microscopy measurements showed a flat surface morphology of the SLs. X-ray diffraction measurements revealed well-pronounced superstructural reflections. The width of their ω-curve did not exceed 2.5 arc min, which indicated a good crystal quality of the SLs.