The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs
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- 作者：Erik Jan Marinissen
- 关键词：system chips ; embedded cores ; test generation ; test protocol ; expansion ; test protocol scheduling
- 刊名：Journal of Electronic Testing
- 出版时间：2002
- 出版年：2002
- 期刊代码：18_09238174
- 类别：soc
- 卷：18
- 期：4/5
- 页码：435-454
- 数据来源：sp
摘要
Modular testing is an attractive approach to testing large system ICs, especially if they are built from pre-designed reusable embedded cores. This paper describes an automated modular test development approach. The basis of this approach is that a core or module test is dissected into a test protocol and a test pattern list. A test protocol describes in detail how to apply one test pattern to the core, while abstracting from the specific test pattern stimulus and response values. Subsequent automation tasks, such as the expansion from core-level tests to system-chip-level tests and test scheduling, all work on test protocols, thereby greatly reducing the amount of compute time and data involved. Finally, an SOC-level test is assembled from the expanded and scheduled test protocols and the (so far untouched) test patterns. This paper describes and formalizes the notion of test protocols and the algorithms for test protocol expansion and scheduling. A running example is featured throughout the paper. We also elaborate on the industrial usage of the concepts described.