Automating test automation
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- 作者：Andrej Pietschker
- 关键词：TTCN ; 3 ; Test automation ; Legacy system
- 刊名：International Journal on Software Tools for Technology Transfer (STTT)
- 出版时间：August, 2008
- 出版年：2008
- 期刊代码：74_1433-2779
- 类别：cp
- 卷：10
- 期：4
- 页码：291-295
- 数据来源：sp
摘要
When trying to introduce TTCN-3 and thus improving test automation we are regularly faced with the issue of legacy test automation. These existing approaches to test automation range from small code developed for a very specific task to large applications with substantial development effort or even purchased solution from third party vendors that might include hardware components. Often these solutions cater for a specific need and their combined application is controlled by humans. A higher degree of test automation can be achieved if these solutions are combined in a test system to enable batch runs for example. TTCN-3 can be a good choice for implementing a future-oriented solution. However, recreating all of the existing parts in TTCN-3 might not be a feasible solution from a business perspective. Instead of refraining from creating an advanced solution, the idea is to use those existing parts to substantially reduce the effort necessary to introduce an improved test automation solution. In this paper, we will report on the successful integration of legacy test solutions using TTCN-3 and creating a new, advanced test system that enables overnight test runs. The paper will illustrate our challenges and experiences from this project.