作者单位:Ma Tiehua,Pei Dongxing,Chen Changxin,Feng Lei,Cui Chunsheng(National Key Laboratory for Electronic Measurement Technology, North University of China ;Key Laboratory of Instrumentation Science & Dynamic Measurement of Ministry of Education,North University of China)马铁华,裴东兴,陈昌鑫,丰雷,崔春生(中北大学电子测试技术国家重点实验室;中北大学仪器科学与动态测试教育部重点实验室)