γγ符合测量中反冲电子谱的利用
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  • 英文篇名:Application of recoil electron spectrum to γγ coincidence measurement
  • 作者:彭海波 ; 刘枫飞 ; 张迁 ; 管明 ; 孙梦利
  • 英文作者:PENG Hai-bo;LIU Feng-fei;ZHANG Qian;GUAN Ming;SUN Meng-li;School of Nuclear Science and Technology,Lanzhou University;
  • 关键词:符合测量 ; NaI探测器 ; 反冲电子
  • 英文关键词:coincident measurement;;NaI detector;;recoil electron
  • 中文刊名:DXWL
  • 英文刊名:College Physics
  • 机构:兰州大学核科学与技术学院;
  • 出版日期:2018-08-15
  • 出版单位:大学物理
  • 年:2018
  • 期:v.37
  • 基金:国家自然科学基金(1105085)资助
  • 语种:中文;
  • 页:DXWL201808010
  • 页数:5
  • CN:08
  • ISSN:11-1910/O4
  • 分类号:41-45
摘要
符合测量是一种常规的测量手段.除了在核物理中的应用,它还被广泛应用于基本物理参数测量、材料分析等领域.此工作讨论了反冲电子谱对γγ符合测量计数率的影响.并设计强、弱两种干扰条件下,γγ符合测量中真符合计数率随不同阈值的变化.实验结果证实,增加反冲电子谱的符合测量能够提高真符合计数率;强、弱本底干扰对总符合计数率有一定影响,但此影响可以通过数据修正的方式消除.
        A coincident technique is a normal technique which has extensive applications in fields of nuclear physics,basic physical parameter measurements and material science. The influence of recoil electron on the coincident count rate is discussed. Count rate of real coincident from gamma-gamma coincidence changes with threshold in conditions of high and low background. The experimental result suggests that spectrum from recoil electron could increase count rate of real coincidence,the count rate of total coincidence would be affected by the count from background in conditions of high and low background. The effect from the background could be deduced by data correction.
引文
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