摘要
测量了50—250keV H+和1.0—3.0MeV Ar11+轰击Si表面过程中辐射的X射线.结果表明,在Ar11+入射的情况下,引起了Si的L壳层上3,4个电子的多电离.计算了Si的K壳层X射线产生截面,并将两体碰撞近似(BEA),平面波恩近似,ECPSSR理论计算与实验值进行了对比.ECPSSR理论与质子产生的截面数据能够很好地符合;而考虑多电离后,BEA理论与Ar11+的实验结果符合较好.
The L-shell X-rays of Si, induced by 50–250 keV proton and 1.0–3.0 MeV Ar11+ ions impacting are measured. It is found that the X-ray induced by Ar11+ is about 36 eV higher than that induced by proton. That indicates that 3, 4 L-shell electrons of Si atom are multiply-ionized by Ar11+ ion impact. The X-ray production cross section is extracted from the yield data and compared with the results from the BEA, PWBA and ECPSSR models. With the same unit incident energy, the cross section induced by Ar11+ is about 3 orders of magnitude larger than that produced by proton. For proton impact, the ECPSSR model gives an accurate prediction to the cross section data. However, the BEA model, considering the change of fluorescence yield due to the multiple-ionization, presents the results that are in better agreement with the experimental results for Ar11+ ions.
引文
[1]Burgdorfer J,Lerner P,Meyer F1991Phys.Rev.A445674
[2]Zhao Y T,Xiao G Q,Zhang X A,Yang Z H,Chen X M,Li F L,Zhang Y P,Zhang H Q,Cui Y,Shao J X,Xu X2005Acta Phys.Sin.5585(in Chinese)[赵永涛,肖国青,张小安,杨治虎,陈熙萌,李福利,张艳萍,张红强,崔莹,邵剑雄,徐徐2005物理学报5585]
[3]Xu Q M,Yang Z H,Du S B,Chang H W,Zhang Y P2011Acta Phys.Sin.60093202(in Chinese)[徐秋梅,杨治虎,杜树斌,常宏伟,张艳萍2011物理学报60093202]
[4]Lugo-Licona M,Miranda J2004Nucl.Instrum.Meth.B1898
[5]Wang X,Zhao Y T,Cheng R,Zhou X M,Xu G,Sun Y B,Lei Y,Wang Y Y,Ren J R,Yu Y,Li Y F,Zhang X A,Li Y Z,Liang C H,Xiao G Q2012Acta Phys.Sin.61193201(in Chinese)[王兴,赵永涛,程锐,周贤明,徐戈,孙渊博,雷瑜,王瑜玉,任洁茹,虞洋,李永峰,张小安,李耀宗,梁昌慧,肖国青2012物理学报61193201]
[6]Slabkowska K,Polasik M2003Nucl.Instrum.Meth.B205123
[7]Wanga P,MacFarlane J J,Moses G A1995Laser Part.Beams13191
[8]Bhalla C P,Richard P1973Phys.Lett.A4519
[9]McGuire C P,Richards P1973Phys.Rev.A81374
[10]Liu Z Q,Cipolla S J1996Comput.Phys.Commun.97315
[11]Lapick Gi,McDaniel F D1981Phys.Rev.A23975
[12]Meyerhof W E,Anholt R,Saylor T K,Lazarus S M,Little A,Chase L F1976Phys.Rev.A141653
[13]Awaya Y,Kambara T,Kanai Y1999Int.J.Mass Spectrom.19249
[14]Krause M O1979J.Phys.Chem.Ref.8307
[15]Garcia J D,Fortner R J,Kavanagh T M1973Rev.Mod.Phys.45111
[16]http://www.srim.org/
[17]Hubbell J H1969Lawrence Livermore National Laboratory Report UCRL-50174
[18]Miranda J,Lucio de O J,Lugo-Licona M F2007Rev.Mex.Fis.S5329
[19]Banas D,Pajek M2002Nucl.Instrum.Meth.B195233
[20]Tanis J A,Shafroth S M,Jacobs W W,Mcabee T,Lapicki G1985Phys.Rev.A31750
[21]Karim K K2011J.Quant.Spectrosc.Rad.Trans.1121026