简易频率特性测试仪的设计与制作
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摘要
文中采用FPGA芯片EP1C3T144C8、DSP芯片TMS320VC5416和单片机STC12C5A60S2作为芯片AD9854设计并制作了一款简易频率特性测试仪。该测试仪能够输出100kHz～50MHz范围的正交信号,能正确的绘制被测网络的幅频特性曲线和相频特性曲线。可通过键盘以100kHz为步进频率进行扫频和点频输出。测试仪测给定RLC网络,中心频率的相对误差小于0.1%,有载品质因数相对误差小于2%。测试结果表明,该测试仪设计方案合理,达到了预期的指标要求。本设计形成的硬件电路模块和软件程序可以用于高等学校等的电类课程的实践教学应用。
In this paper,FPGA chip EP1C3T144C8,DSP chip TMS320VC5416 and single chip microcomputer STC12C5A60S2 are used as control and computing chips. Using the Orthogonal demodulation principle,a simple frequency characteristic tester is designed and fabricated by DDS chip AD9854. The tester can output orthogonal signals in the range of 100 KHz to 50 MHz,and can correctly plot the amplitude-frequency characteristic curve and the phase-frequency characteristic curve of the tested network. The frequency sweep and point frequency output can be performed through the keyboard at a step frequency of 100 kHz. The tester measures the given RLC network,the relative error of the center frequency is less than 0.1%,and the relative error of the loaded quality factor is less than 2%.The test results show that the design of the tester is reasonable and meets the expected target requirements.The hardware circuit modules and software programs formed by this design can be used in practical teaching applications of electrical courses such as colleges and universities.
In this paper,FPGA chip EP1C3T144C8,DSP chip TMS320VC5416 and single chip microcomputer STC12C5A60S2 are used as control and computing chips. Using the Orthogonal demodulation principle,a simple frequency characteristic tester is designed and fabricated by DDS chip AD9854. The tester can output orthogonal signals in the range of 100 KHz to 50 MHz,and can correctly plot the amplitude-frequency characteristic curve and the phase-frequency characteristic curve of the tested network. The frequency sweep and point frequency output can be performed through the keyboard at a step frequency of 100 kHz. The tester measures the given RLC network,the relative error of the center frequency is less than 0.1%,and the relative error of the loaded quality factor is less than 2%.The test results show that the design of the tester is reasonable and meets the expected target requirements.The hardware circuit modules and software programs formed by this design can be used in practical teaching applications of electrical courses such as colleges and universities.
引文
[1]国成哲.频率特性测试仪的设计[J].电子设计工程,2017 25(11):102-106.
[2]曾繁政.基于AD9854的简易频率特性测试仪的设计[J].贺州学院学报,2015,31(1):133-138.
[3]任庆芳.基于神AD8302的简易阻抗测试仪[J].电子测量技术,2016(2):106-109.
[4]林泽洪.基于FPGA的多通道自动温度控制设计[J].核电子学与探测技术,2013(9):1127-1130.
[5]稻叶保.模拟技术应用技巧101例[M].北京:科学出版社,2013.
[6]黄根春.全国大学生电子设计竞赛教程—基于TI器件设计方法[M].北京:电子工业出版社,2011.
[7]吴凌燕.基于Mulitisim11的串联谐振电路特性研究[J].国外电子测量技术,2011,30(8):84-86.
[8]陈松.一种简易数字控制频率特性测试仪的设计[J].电子器件,2015,38(4):868-872.
[9]陈尚松.电子测量与仪器[M]. 3版.北京:电子工业出旅社,2012.
[10]王敏.基于AD9854的简易频率特性测试仪[J].数字技术与应用,2013(9):69-70.
[11]孙冬娇.数字频率特性测试仪的设计[J].现代电子技术,2014,37(21):73-75.
[12]李鹏.基于FPGA的频率特性测试仪的设计[J].电脑知识与技术,2016,12(4):218-220.
[13]远坂俊昭.测量电子电路设计(模拟篇)[M].北京:科学出版社,2013.
[14]李苑,陈光达.基于神经网络的AD8302相位响应特性曲线校正方法[J].信息通信,2017(4):44-47.
[15]刘丹.基于神AD8302的激光外差干涉信号解调技术[J].激光技术,2015(5):333-336.
[16]刘静.基于神AD8302的高精度幅相检测系统的设计[J].计算机测量与控制,2011,19(2):253-255.
[17]黄智伟.全国大学生电子设计竞赛常用电路模块制作[M].北京:北京航空航天大学出版社,2011.
[18]朱旭芳.基于零中频解调的高精度频率特性测试仪设计[J].实验室探索与研究,2016(6):62-65.
[19]孟瑞丽.一种数字频率特性测试仪的设计[J].南京信息工程大学学报:自然科学版,2015(2):137-141.
[20]吕念之.基于DDS的数字式频率特性测试仪的软件设计[J].菏泽学院学报,2015(2):24-28.
[21]董宝玉.基于AD9854与STM32的频率特性测试仪设计[J].化工自动化及仪表,2014(6):655-359.
[2]曾繁政.基于AD9854的简易频率特性测试仪的设计[J].贺州学院学报,2015,31(1):133-138.
[3]任庆芳.基于神AD8302的简易阻抗测试仪[J].电子测量技术,2016(2):106-109.
[4]林泽洪.基于FPGA的多通道自动温度控制设计[J].核电子学与探测技术,2013(9):1127-1130.
[5]稻叶保.模拟技术应用技巧101例[M].北京:科学出版社,2013.
[6]黄根春.全国大学生电子设计竞赛教程—基于TI器件设计方法[M].北京:电子工业出版社,2011.
[7]吴凌燕.基于Mulitisim11的串联谐振电路特性研究[J].国外电子测量技术,2011,30(8):84-86.
[8]陈松.一种简易数字控制频率特性测试仪的设计[J].电子器件,2015,38(4):868-872.
[9]陈尚松.电子测量与仪器[M]. 3版.北京:电子工业出旅社,2012.
[10]王敏.基于AD9854的简易频率特性测试仪[J].数字技术与应用,2013(9):69-70.
[11]孙冬娇.数字频率特性测试仪的设计[J].现代电子技术,2014,37(21):73-75.
[12]李鹏.基于FPGA的频率特性测试仪的设计[J].电脑知识与技术,2016,12(4):218-220.
[13]远坂俊昭.测量电子电路设计(模拟篇)[M].北京:科学出版社,2013.
[14]李苑,陈光达.基于神经网络的AD8302相位响应特性曲线校正方法[J].信息通信,2017(4):44-47.
[15]刘丹.基于神AD8302的激光外差干涉信号解调技术[J].激光技术,2015(5):333-336.
[16]刘静.基于神AD8302的高精度幅相检测系统的设计[J].计算机测量与控制,2011,19(2):253-255.
[17]黄智伟.全国大学生电子设计竞赛常用电路模块制作[M].北京:北京航空航天大学出版社,2011.
[18]朱旭芳.基于零中频解调的高精度频率特性测试仪设计[J].实验室探索与研究,2016(6):62-65.
[19]孟瑞丽.一种数字频率特性测试仪的设计[J].南京信息工程大学学报:自然科学版,2015(2):137-141.
[20]吕念之.基于DDS的数字式频率特性测试仪的软件设计[J].菏泽学院学报,2015(2):24-28.
[21]董宝玉.基于AD9854与STM32的频率特性测试仪设计[J].化工自动化及仪表,2014(6):655-359.