γ射线及质子辐照导致CCD光谱响应退化的机制
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摘要
光谱响应是表征CCD性能的重要参数。为了研究辐射环境对CCD光谱响应产生影响的规律及物理机制,开展了不同粒子辐照实验,对CCD光谱响应曲线的退化形式及典型波长下CCD光响应的退化情况进行了分析。辐射效应对CCD光谱响应的影响可以分为电离总剂量效应和位移效应导致的退化,本文从这两种辐射效应出发,采用~(60)Co-γ射线及质子两种辐照条件,研究了CCD光谱响应的退化规律。针对4~(60) nm(蓝光)和700 nm(红光)等典型CCD光响应波长,从辐射效应导致的损伤缺陷方面分析了CCD光谱响应退化的物理机制。研究发现,在~(60)Co-γ射线辐照时CCD光谱响应曲线变化是由于暗信号增加导致的,而质子辐照导致CCD对700 nm波长的光响应退化明显大于4~(60) nm波长的光响应,且10 Me V质子导致的损伤比3 Me V质子更明显,表明位移损伤缺陷易导致CCD光谱响应退化。结果表明,电离总剂量效应主要导致CCD光谱响应整体变化,而位移效应则导致不同波长光的响应差异增大。
Spectral response is one of the important parameters of CCD. In order to study the effects and physical mechanism of spectral response of CCD being affected by radiation environmental,the different particles irradiation tests are done,also the degradation form of CCDs' spectral response and degradation of CCDs' light response on typical wavelength are investigated. The decays of spectral response in CCD exposed to radiation environment consist of total ionizing dose effects and displacement damage effects. This paper investigated the degradation law and physics mechanism of spectral response in CCD irradiated by~(60)Co-γ and proton. In view of the typical CCD optical response wavelength of 4~(60)nm( blue light) and 700 nm( red light),the physical mechanism of the degradationof CCD spectral response was analyzed from the radiation induced damage defects. The results suggest that the CCDs' spectral response curve change induced by~(60)Co-gamma ray is due to the dark signal increases. The CCDs' spectral response degradation induced by proton is significantly higher at700 nm wavelength light response than at 4~(60)nm. The degradation is more obvious at 10 Me V proton than 3 Me V proton. So it is clearly that displacement damage defects easily lead to CCD spectral response degradation. The results indicate that the total ionizing dose effects inducing a global degradation of spectrum response,while displacement damage inducing the contrast of spectrum response on different wave length significantly.
Spectral response is one of the important parameters of CCD. In order to study the effects and physical mechanism of spectral response of CCD being affected by radiation environmental,the different particles irradiation tests are done,also the degradation form of CCDs' spectral response and degradation of CCDs' light response on typical wavelength are investigated. The decays of spectral response in CCD exposed to radiation environment consist of total ionizing dose effects and displacement damage effects. This paper investigated the degradation law and physics mechanism of spectral response in CCD irradiated by~(60)Co-γ and proton. In view of the typical CCD optical response wavelength of 4~(60)nm( blue light) and 700 nm( red light),the physical mechanism of the degradationof CCD spectral response was analyzed from the radiation induced damage defects. The results suggest that the CCDs' spectral response curve change induced by~(60)Co-gamma ray is due to the dark signal increases. The CCDs' spectral response degradation induced by proton is significantly higher at700 nm wavelength light response than at 4~(60)nm. The degradation is more obvious at 10 Me V proton than 3 Me V proton. So it is clearly that displacement damage defects easily lead to CCD spectral response degradation. The results indicate that the total ionizing dose effects inducing a global degradation of spectrum response,while displacement damage inducing the contrast of spectrum response on different wave length significantly.
引文
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[18]VERHOEVE P,PROD'HOMME T,OOSTERBROEK T,et al..Optical and dark characterization of the PLATO CCD at ESA[J].SPIE,2016,9915:99150Z.
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[20]AHMED N,LU G N,ROY F.Total ionizing dose effects on quantum efficiency and dark current of cmos image sensors with deep-trench-isolation[J].Sens.Lett.,2015,13(7):539-542.
[2]SEABROKE G,HOLLAND A.Modelling radiation damage to ESA's Gaia satellite CCDs[J].SPIE,2008,7021(3):70211P-1-12.
[3]PROD'HOMME T,HOLL B,LINDEGREN L,et al..The impact of CCD radiation damage on Gaia astrometry-Ⅱ.Effect of image location errors on the astrometric solution[J].Monthly Notices Royal Astronom.Soc.,2012,422(4):2786-2807.
[4]VAN DYKE D W.Effects of CTE degradation on cycle 18 observations with the STIS CCD[S].Instrument Science Report STIS 2011-02(v2),2011.
[5]翁雪涛,唐遵烈,周建勇,等.1 024×1 024全帧CCD器件[J].半导体光电,2011,32(4):459-461.WENG X T,TANG Z L,ZHOU J Y,et al..1 024×1 024 full frame CCD devices[J].Semicond.Optoelectron.,2011,32(4):459-461.(in Chinese)
[6]HOPKINSON G R,SHORT A,VETEL C,et al..Radiation effects on astrometric CCDs at low operating temperatures[J].IEEE Trans.Nuc.Sci.,2005,52(6):2664-2671.
[7]SROUR J R,LO D H.Universal damage factor for radiation-induced dark current in silicon devices[J].IEEE Trans.Nuc.Sci.,2000,47(6):2451-2459.
[8]HOPKINS I H,HOPKINSON G R,JOHLANDER B.Proton-induced charge transfer degradation in CCDs for near-room temperature applications[J].IEEE Trans.Nuc.Sci.,1994,41(6):1984-1991.
[9]WANG Z,MA W,HUANG S,et al..Characterization of total ionizing dose damage in COTS pinned photodiode CMOS image sensors[J].AIP Adv.,2016,6(3):077108.
[10]钟玉杰,周玉红,雷仁方,等.γ辐照对1 024×1 152可见光CCD的影响研究[J].半导体光电,2010,31(6):846-848.ZHONG Y J,ZHOU Y H,LEI R F,et al..Effects ofγirradiation on 1 024×1 152 CCD[J].Semicond.Optoelectron.,2010,31(6):846-848.(in Chinese)
[11]ANDERSON J,BEDIN L R.An empirical pixel-based correction for imperfect CTE.I.HST's advanced camera for surveys[J].Public.Astronom.Soc.Pacific,2010,122(895):1035-1064.
[12]WANG Z,CHEN W,HUANG S,et al..Degradation of saturation output of the COTS array charge-coupled devices induced by total dose radiation damage[J].Nuc.Instrum.Methods Phys.Res.,2014,751(6):31-35.
[13]HOU R,ZHAO S,YAO Z,et al..Analysis of charge transfer inefficiency of CCD equipment under proton radiation[C].International Conference on Electronics and Optoelectronics,IEEE,Taiyuan,China,2011:V2-272-V2-274.
[14]KONRADI A,HARDY A C,ATWELL W.Radiation Environment Models and The Atmospheric Cutoff[M].Paris:Rousseau on Education,2015:618-624.
[15]HALL D J,BUSH N,MURRAY N,et al..Challenges in photon-starved space astronomy in a harsh radiation environment using CCDs[C].Optics for EUV,X-Ray,and Gamma-Ray AstronomyⅦ,Montreal,Canada,2015:96020U.
[16]BAGGETT S M,SOSEY M.HST/WFC3:understanding and mitigating radiation damage effects in the CCD detectors[J].SPIE,2016,55(10):99045D.
[17]MARCELOT O,GOIFFON V,RAINE M,et al..Radiation effects in CCD on CMOS devices:first analysis of TID and DDD effects[J].IEEE Trans.Nuc.Sci.,2015,62(6):2965-2970.
[18]VERHOEVE P,PROD'HOMME T,OOSTERBROEK T,et al..Optical and dark characterization of the PLATO CCD at ESA[J].SPIE,2016,9915:99150Z.
[19]NETZER R,AVERY K,KEMP W,et al..Total ionizing dose effects on commercial electronics for cube sats in low earth orbits[C].Radiation Effects Data Workshop,IEEE,Boston,USA,2015:1-7.
[20]AHMED N,LU G N,ROY F.Total ionizing dose effects on quantum efficiency and dark current of cmos image sensors with deep-trench-isolation[J].Sens.Lett.,2015,13(7):539-542.