摘要
Effect of hydrogen(H_2) treatment during the GaN barrier growth on the electroluminescence performance of green In GaN/GaN single-quantum-well light-emitting diodes(LEDs) grown on Si substrates is experimentally investigated. We prepare two LED samples with different carrier gas compositions during the growth of GaN barrier. In the H_2 free LED, the GaN barrier is grown in full nitrogen(N_2) atmosphere. For the other H_2 treated LED, a mixture of N_2 and H_2 was used as the carrier gas. It is observed that V-shaped pits decrease in size after H_2 treatment by means of the scanning electron microscope. Due to the fact that the p–n junction interface would be closer to the p-GaN as a result of smaller V-shaped pits, the tunneling barrier for holes to inject into the In GaN quantum well would become thicker after H_2 treatment. Hence, the external quantum efficiency of the H_2 treated LED is lower compared to the H_2 free LED. However, LEDs would exhibit a better leakage behavior after H_2 treatment during the GaN barrier growth because of more effective blocking of the threading dislocations as a result of the H_2 etching at V-shaped pits.
Effect of hydrogen(H_2) treatment during the GaN barrier growth on the electroluminescence performance of green In GaN/GaN single-quantum-well light-emitting diodes(LEDs) grown on Si substrates is experimentally investigated. We prepare two LED samples with different carrier gas compositions during the growth of GaN barrier. In the H_2 free LED, the GaN barrier is grown in full nitrogen(N_2) atmosphere. For the other H_2 treated LED, a mixture of N_2 and H_2 was used as the carrier gas. It is observed that V-shaped pits decrease in size after H_2 treatment by means of the scanning electron microscope. Due to the fact that the p–n junction interface would be closer to the p-GaN as a result of smaller V-shaped pits, the tunneling barrier for holes to inject into the In GaN quantum well would become thicker after H_2 treatment. Hence, the external quantum efficiency of the H_2 treated LED is lower compared to the H_2 free LED. However, LEDs would exhibit a better leakage behavior after H_2 treatment during the GaN barrier growth because of more effective blocking of the threading dislocations as a result of the H_2 etching at V-shaped pits.
引文
[1]Suihkonen S et al 2007 J.Cryst.Growth 300 324
[2]Zhou X R et al 2017 Nanoscale Res.Lett.12 354
[3]Czernecki R et al 2015 J.Cryst.Growth 414 38
[4]Suihkonen S et al 2007 J.Cryst.Growth 298 740
[5]Le L C et al 2012 Appl.Phys.Lett.101 252110
[6]Quan Z J et al 2015 J.Appl.Phys.118 193102
[7]Quan Z J et al 2014 J.Appl.Phys.116 183107
[8]Mo C L et al 2005 J.Cryst.Growth 285 312
[9]Liu J L et al 2011 Appl.Phys.Lett.99 111112
[10]Wang G X et al 2015 Semicond.Sci.Technol.30 015018
[11]Harbers G et al 2007 J.Disp.Technol.3 160
[12]Ren P et al 2016 J.Phys.D 49 175101
[13]Moon Y T et al 2000 J.Vac.Sci.Technol.B 18 2631
[14]Shen Y C et al 2007 Appl.Phys.Lett.91 141101
[15]Kim M H et al 2007 Appl.Phys.Lett.91 183507
[16]Mártil I et al 1997 J.Appl.Phys.81 2442
[17]Jia C et al 2013 Opt.Express 21 8444
[18]Niu N H et al 2007 Solid-State Electron.51 860
[19]Leyer M et al 2008 J.Cryst.Growth 310 4913
[20]Qi W J et al 2017 J.Appl.Phys.122 084504
[21]Czernecki R et al 2014 J.Cryst.Growth 402 330
[22]Morishita Y et al 1995 Appl.Phys.Lett.67 2500
[23]Zhang Y P et al 2017 Appl.Phys.Lett.110 033506
[24]Chitnis A,Kumar A,Shatalov M,Adivarahan V,Lunev A,Yang J W,Simin G,Khan M A,Gaska R and Shur M 2000Appl.Phys.Lett.77 3800
[25]Cao X A,Stokes E B,Sandvik P M,Leboeuf S F et al 2002IEEE Electron Device Lett.23 535
[26]Shan Q F,Meyaard D S,Dai Q,Cho J,Schubert E F,Son J K and Sone C 2011 Appl.Phys.Lett.99 253506
[27]Kim J,Kim J,Tak Y,Chae S,Kim J Y and Park Y 2013IEEE Electron Device Lett.34 1409
[28]Han S H,Lee D Y,Shim H W,Lee J W,Kim D J,Yoon S,Kim Y S and Kim S T 2013 Appl.Phys.Lett.102251123
[29]Hangleiter A,Hitzel F,Netzel C,Fuhrmann D,Rossow U,Ade G and Hinze P 2005 Phys.Rev.Lett.95 127402
[30]Yeh Y H,Chen K M,Wu Y H,Hsu Y C,Yu T Y and Lee W I 2011 J.Cryst.Growth 333 16
[31]Yeh Y H,Chen K M,Wu Y H,Hsu Y C and Lee W I 2011J.Cryst.Growth 314 9
[32]Ren X C,Riley J R,Koleske D D and Lauhon L J 2015Appl.Phys.Lett.107 022107