浪涌抑制器瞬态尖峰电压测试后失效原因分析
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摘要
论文根据浪涌抑制器在瞬态尖峰电压测试后失效的现象,对器件失效部位进行故障定位并对器件内部电路图进行拍照分析,分析研究电路原理以及相关测试标准,建立了故障树,逐一分析排除,得出了器件在瞬态尖峰电压测试后失效的原因,并进行了故障复现,提出了预防解决措施。
In this paper,according to the phenomenon of transient peak voltage test,the failure location of the device failure location and the device internal circuit diagram are analyzed,the circuit principle and related test standards are analyzed,the faulttree is established,the failure reason is analyzed,and the failure of the device is obtained after the transient peak voltage test,and the fault recurrence is proposed,and preventive measures are proposed.
In this paper,according to the phenomenon of transient peak voltage test,the failure location of the device failure location and the device internal circuit diagram are analyzed,the circuit principle and related test standards are analyzed,the faulttree is established,the failure reason is analyzed,and the failure of the device is obtained after the transient peak voltage test,and the fault recurrence is proposed,and preventive measures are proposed.
引文
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[13]李哲.电子元器件的可靠性[M].天津:天津大学出版社,1991:52-89.LI Zhe.Reliability of Electronic Components[M]. Tian-jin:Tianjin University Press,1991:52-89.
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[15]陈昭宪.电子元器件的失效分析[J].电子产品可靠性与环境试验,1996(1):65-69.CHEN Zhaoxian. Failure Analysis of Electronic Compo-nents[J]. Electronic Product Reliability and Environmen-tal Testing,1996(1):65-69.
[2]张伟,张泰峰.基于MOSFET适用于母线开关的浪涌抑制电路[J].电源技术,2015(10):67-68.ZHANG Wei,ZHANG Taifeng. Surge Suppression CircuitBased on MOSFET for Bus Switch[J]. Power Technology,2015(10):67-68.
[3]余海涛,郭远东.浪涌防护设计思路与常见防护电路[J].环境技术,2013(10):21-24.YU Haitao,GUO Yuandong. Surge Protection DesignIdeas and Common Protection Circuit[J]. EnvironmentalTechnology,2013(10):21-24.
[4]刘增波,刘宗玉,张强.一种浪涌抑制电路过程分析与验证[J].计算机测量与控制,2016(11):75-78.LIU Zengbo,LIU Zongyu,ZHANG Qiang. Analysis andVerification of a Surge Suppression Circuit[J]. ComputerMeasurement&Control,2016(11):75-78.
[5]王凤岩,张肱霈,张燕.机载设备的浪涌抑制[J].电子信息对抗技术,2013(05):78-82.WANG Fengyan,ZHANG Gongpei,ZHANG Yan. PowerSupply Surge Inhibition of Airborne Equipment[J]. Elec-tronic Information Countermeasure Technology,2013(5):78-82.
[6]周源泉,翁朝曦.可靠性增长[M].北京:科学出版社,1992:36-78.ZHOU Yuanquan,WENG Chaoxi. Reliability Growth[M].Beijing:Science Press,1992:36-78.
[7]Verkleij D. The use of the Focused Ion Beam in failureanalysis[J]. Microelectronics and Reliability,1998:105-108.
[8]Larry H. Proc. Ann.Crow. Reliability Growth[M]. Reliabil-ity and Maintainability Symp,1996:45-70.
[9]田耀亭.国产二次集成电路的主要失效模式[J].电子产品可靠性与环境试验,1997(4):22-24.TIAN Yaoting. Main Failure Mode of Domestic SecondaryIntegrated Circuit[J]. Electronic Product Reliability andEnvironmental Testing,1997(4):22-24.
[10]杨仲江,卢燕,曹书华.瞬态过电压抑制技术的研究[J].安全与电磁兼容,2007(5):64-67.YANG Zhongjiang,LU Yan, CAO Shuhua.Study onTransient Over-voltage Suppression Technique[J]. Safe-ty&EMC,2007(5):64-67.
[11]林红,周鑫霞.模拟电路基础[M].北京:清华大学出版社,2007:25-46.LIN Hong,ZHOU Xinxia. Analog Circuit Foundation[M]. Beijing:Tsinghua University Press,2007:25-46.
[12]郭海涛,周军,杨宏伟.尖脉冲干扰滤波器设计的关键问题[J].电力自动化设备,2010(9):93-95.GUO Haitao,ZHOU Jun,YANG Hongwei.Key Problemsof The Design of Pulse Interference Filter[J]. ElectricPower Automation Equipment,2010(9):93-95.
[13]李哲.电子元器件的可靠性[M].天津:天津大学出版社,1991:52-89.LI Zhe.Reliability of Electronic Components[M]. Tian-jin:Tianjin University Press,1991:52-89.
[14]黄云,恩云飞.电子元器件失效模式影响分析技术[J].电子元件与材料,2007(4):65-67.HUANG Yun,EN Yunfei. Failure Modes Effects Analy-sis of Electronic Components[J]. Electronic Componentsand Materials,2007(4):65-67.
[15]陈昭宪.电子元器件的失效分析[J].电子产品可靠性与环境试验,1996(1):65-69.CHEN Zhaoxian. Failure Analysis of Electronic Compo-nents[J]. Electronic Product Reliability and Environmen-tal Testing,1996(1):65-69.